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Derniers dépôts
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Nombre de notices
Mots-clés
CH4
Etching
B2 Semiconducting alloys
Carbon
Band gap
Selenization
CaTiO3Pr^3^+
Ablation laser
Transfert d'énergie
Sputtering
Structure
B3 Solar cells
Applications industrielles
Calcined clay
3 nm in size
Spectroscopic ellipsometry
A Thin films
AuCu alloy
Magnetron sputtering
Colloidal solution
Biocapteurs
Carbon nitride
Buffer Couple
PECVD
BOMBARDMENT
CIGSe
Band alignment
Bixbyite
Nanotubes
Semiconductors
B2 Quaternary
Cathepsin
A-CNx
Titanium dioxide
X-ray diffraction
Physical vapor deposition
C Photoelectron spectroscopy
Capacitance
Anatase
Chalcogenides
Vanadium Sesquioxide
A1 Characterization
Nanocomposite
Amorphous
Bipolar resistive switching BRS
Resistive switching
Residual stress
Functionalization
Thin films
Chemical and biological sensors
X-ray photoelectron spectroscopy
A Multilayers
B Chemical synthesis
Copper
Plasmas froids
TiO2
V2O3
AZO thin films
Atomic layer etching
Low-pressure plasma processing
XPS
NEXAFS
Ambipolar material
Optical properties
CHLORINE PLASMAS
Non-volatile memory
Oxides
Amyloid precursor
Adsorption
Transmission electron microscopy
Mott insulator
Alzheimer's disease
A Chalcogenides
Chemical detection
B2 Semiconducting indium compounds
AlN
Atomic force microscopy
B1 Inorganic compounds
Carbon nanotubes
CNTs’ collapse
Carbon Nanotube
Avalanche breakdown
SF 6
Biofilms microbiens
A3 Physical vapor deposition processes
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
Films
Biomasse
Thin film
Plasma etching
Scanning electron microscopy
Chalcogenide glass
Aryl-diazonium salts
TEM
Kirkendall effect
Sol-gel
Mott insulators
Aluminium nitride
Alloying
Chalcogenide